(日本語) SEM/CP/AFM/LSCM表面観察セミナーが開催されました

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(日本語) 平成30年度 全学共同利用施設 説明会資料について

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(日本語) 施設説明会&表面分析ユーザーズミーティング開催のお知らせ

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About entry of nanotechnology research number at equipment reservation

Thank you for always using.

The procedure for applying for nanotechnology platform support in 2018 fiscal year will start soon.

Those who are planning to receive the support are not required to enter your research number in this facility equipment reservation site until your research number is confirmed.

After your research number of the next fiscal year is confirmed, please input it when you reserve this facility equipment.

Regarding usage fee for April to May, we will apply usage classification retroactively.

Thank you for your review.

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Announcement of AES & XPS maintenance schedule

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For the following schedule, each equipment can not be used for maintenance.

AES: 2/20 (Tue.) 9: 00-2 / 23 (Fri.) 17: 00 Stage exchange work, objective lens repair

XPS: 2/26 (Mon.) 13: 00 ~ 3/2 (Fri.) 17: 00 X-ray source exchange work

We apologize for any inconvenience to our users, but thank you for your understanding.

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About laboratory’s schedule during the New Year period.

We will inform the maintenance period of each equipment during the year-end and New Year period.

XPS・CP・AFM・LSCM: 12/28 17: 00 ~ 1/4 11:00

SEM:12/28 21: 00 ~ 1/4 11:00

AES: 12/28 15: 00 ~ 1/4 11:00

In addition, the laboratory also will be closed from 12/28 17:00 to 1/4 9:00.

We would appreciate your continued kind cooperation next year.

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Notice of completion of repair backscattered electron detector of SEM

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Repair work was completed today on the defect of the backscattered electron image (COMPO image) of SEM that had occurred since around last month.

Although the cause is unknown, it is confirmed that some kind of powder adheres to the detector.

For users handling powder samples, fix them firmly to the adhesive and blow off the powder firmly using a blower when fixing the sample,  and introduce it to the equipment.

Thanks for your understanding.

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About the problem of backscattered electron image (composition image)

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Currently, SEM has a phenomenon that noise occurs when observing the composition image.

This is because the backscattered electron detector have problems.

We are planning to exchange the backscattered electron detector during the year.

For users who want to observe the composition image, please observe by setting the accelerating voltage and spot size of the electron beam to a large value as countermeasure before replacement.

By lowering the scan speed, image noise is reduced.

We apologize for any inconvenience, thank you for your understanding.

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Notification of Auger Electron Spectroscope repair

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AES can not be used due to stage repair between 10am on November 6 and 12am on November 8.

This is repair work on the problem that the center of the view does not become the rotation center when stage rotate.

AES is available until the day of repair.

We are sorry for the inconvenience, thank you for your understanding.

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About Consumables related to AFM

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For the gel pack that stores cantilevers and cantilever which is necessary for using AFM, We have added items of these consumable supplies to the laboratory’s detailed usage regulations in November.

・consumable supply

consumable supply a unit price
microcantilever(SI-DF40) 3,800yen
microcantilever(SN-AF01) 3,300yen
gel pack for microcantilever 4,600yen

 

Until now, when using AFM, users had to prepare cantilevers on their own.

From now on it is possible to use the cantilever of the facility.

In that case we will offer the above consumable supply at each unit price.

Consumables expenses will be charged together with equipment usage fee.

For those who wish to use AFM consumables, please ask the facility staff.

Thank you.

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