About laboratory’s schedule during the New Year period.

We will inform the maintenance period of each equipment during the year-end and New Year period.

XPS・CP・AFM・LSCM: 12/28 17: 00 ~ 1/4 11:00

SEM:12/28 21: 00 ~ 1/4 11:00

AES: 12/28 15: 00 ~ 1/4 11:00

In addition, the laboratory also will be closed from 12/28 17:00 to 1/4 9:00.

We would appreciate your continued kind cooperation next year.

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Notice of completion of repair backscattered electron detector of SEM

Thank you always using.

Repair work was completed today on the defect of the backscattered electron image (COMPO image) of SEM that had occurred since around last month.

Although the cause is unknown, it is confirmed that some kind of powder adheres to the detector.

For users handling powder samples, fix them firmly to the adhesive and blow off the powder firmly using a blower when fixing the sample,  and introduce it to the equipment.

Thanks for your understanding.

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About the problem of backscattered electron image (composition image)

Thank you for always using.

Currently, SEM has a phenomenon that noise occurs when observing the composition image.

This is because the backscattered electron detector have problems.

We are planning to exchange the backscattered electron detector during the year.

For users who want to observe the composition image, please observe by setting the accelerating voltage and spot size of the electron beam to a large value as countermeasure before replacement.

By lowering the scan speed, image noise is reduced.

We apologize for any inconvenience, thank you for your understanding.

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Notification of Auger Electron Spectroscope repair

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AES can not be used due to stage repair between 10am on November 6 and 12am on November 8.

This is repair work on the problem that the center of the view does not become the rotation center when stage rotate.

AES is available until the day of repair.

We are sorry for the inconvenience, thank you for your understanding.

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About Consumables related to AFM

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For the gel pack that stores cantilevers and cantilever which is necessary for using AFM, We have added items of these consumable supplies to the laboratory’s detailed usage regulations in November.

・consumable supply

consumable supply a unit price
microcantilever(SI-DF40) 3,800yen
microcantilever(SN-AF01) 3,300yen
gel pack for microcantilever 4,600yen

 

Until now, when using AFM, users had to prepare cantilevers on their own.

From now on it is possible to use the cantilever of the facility.

In that case we will offer the above consumable supply at each unit price.

Consumables expenses will be charged together with equipment usage fee.

For those who wish to use AFM consumables, please ask the facility staff.

Thank you.

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About The 5th micro surface analysis research Users Meeting and Information seminar on Joint-use Facilities

Sorry, this entry is only available in 日本語.

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Information about discontinuation of facility equipment due to the planned elecctric power outage

Thank you for always using.

We will stop the use of all equipment and facility from 9/1 (Fri) 9:00 to 9/4 (Mon) 12:00 because of the whole university power cut.

During the same time, the reservation site is also unavailable.

We appreciate your understanding in this matter.

 

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Surface observation seminar by MASAOU was held on July 21.

Sorry, this entry is only available in 日本語.

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Information about periodical maintenance for AES

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7/24 (Monday) – 7/28 (Friday), there is a periodic maintenance of Auger Electron Spectroscope(AES).

In the period, this device is not available. Please acknowledge it.

You can use for other devices in this period.

The maintenance period might be extended without notice.

In that case, we will cancel reservations immediately after the maintenance period.

Please kindly understand the situation.

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(日本語) 2017年度 春季 施設利用説明会(合同)の資料&予約時のナノテク課題番号について

Sorry, this entry is only available in 日本語.

Posted in ナノテクプラットフォーム, Book site, Laboratory of XPS | Leave a comment